Adaptive Test is a term coined to describe a suite of statistical methods to control the testing of semiconductor chips. In 2010 Intellitech 
hosted a seminar series on Adaptive Test
The International Technology Roadmap for Semiconductors releases a biannual report on the status of semiconductor design, manufacture and use. Within the ITRS report is the status of test technology and Chapter 6 provides an overview of adaptive test with a discussion about the following topics.
• An introduction to Adaptive Test and a descriptions of emerging applications;
• Specific examples of Adaptive Test applications that are in use today and others that will be in the future
• A description of the challenges of Adaptive Test
• The emerging requirements to ensure the industry is able to fully exploit Adaptive Test.
The introduction to Chapter 6 of the ITRS Test Technology describes Adaptive Test this way.
“Adaptive Test” use is increasing because of its ability to lower test cost, to increase yield, to provide better quality and reliability and to improve data collection for yield learning well beyond what has been possible historically with static optimization methods. Adaptive Test realizes these benefits by providing an infrastructure for continually optimizing IC test within the constraints of pre-defined rules. To fully exploit Adaptive Test, it is important to understand its general principles, as well as specific methods and skills required to use it.
The International Technology Roadmap for Semiconductors is a set of documents produced by a group of semiconductor industry experts. These experts are representative of the sponsoring organizations which include the Semiconductor Industry Associations of the United States, Europe, Japan, South Korea and Taiwan.